Suppression of the Regrowth Interface Leakage Current in AlGaN/GaN HEMTs by Unactivated Mg Doped GaN Layer作者：劉婷, 渡邊浩崇 ,新田州吾,王嘉,于國浩,安藤裕二, 本田善央, 天野浩,田中墩之,小出康夫單位：名古屋大學未來材料系統(tǒng)研究所，名古屋大學電子學系，北京化工大學數(shù)理學院
Transverse electric lasing at record short wavelength 244.63 nm from GaN quantum wells with weak exciton localizationAuthor：Maocheng Shan, Yi Zhang, Xiaohang Li, Changqing ChenInstitute：Wuhan National Laboratory for Optoelectronics, King Abdullah University of Science and Technology (KAUST)
